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 Wysłany: Wto 23:11, 21 Gru 2010 Temat postu: ugg milano Wavelet Analysis for fabric defect dete |
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Wavelet Analysis for fabric defect detection of image enhancement
13 Conclusion 1) image processing is an important field of application of wavelet analysis, wavelet analysis in recent years has proven to be a powerful image processing tools, this can be wavelet transform proved easier to isolate the noise or other unwanted information , wavelet analysis for defect identification, image enhancement, can effectively eliminate the noise, remove the texture of fabric, have a good prospect. Especially the layered effect of threshold on the noise reduction advantages in the global threshold for noise reduction. 2) global thresholding and layered process of noise reduction threshold value, the effective removal of noise, texture, etc. Also,[link widoczny dla zalogowanych], some small defects have been filtered out, and if defects in the recognition of discrete classes, only with the wavelet denoising binary segmentation to create a small defect may be missed, which is its image processing for discrete class of defects in the defects to be studied further. References: [1] Li Li light, Hsiu-Po. Image processing for automatic detection of fabric defect progress [J]. Donghua University: Natural Science, 2002,28 (4) t118-121. [2] Wang Jiawen,[link widoczny dla zalogowanych], Cao Yu. MATLAB6.5 Graphics and Image Processing [M]. Beijing: National Defence Industry Press, 2004. [3] Fei Sike Technology R & D center. Wavelet analysis and application of auxiliary MATLAB6.5 [M]. Beijing; Electronics Industry Press, 2003. [4] Dong Changhong,[link widoczny dla zalogowanych], Gao, Yu Xiaohai. Matlab toolbox principle and application of wavelet analysis [M3. Beijing: National Defence Industry Press, 2004. [5] Yu Chengbo. Implementation of digital image processing and MATLAB [M]. Chongqing: Chongqing University Press, 2003. [6] Dong Changhong, Lai Zhiguo,[link widoczny dla zalogowanych], Yu Xiaohai. Matlab image processing and application of [MJ. Beijing: National Defence Industry Press, 2004. ResearchoftheApplicationofWaveletAnalysistoImageInhancementforFabricDefectsDetectionWANGZhao-li, WANGLi-ruing, GAOShui-ping (CollegeofTextileandClothing, QingdaoUniversity, Qingdao266071, China) Abstract ~ TheapplicationofwaveletanalysistOimagede - noisingtoenhanceimagesforautomaticallyde - tectingfabricdefectsisprobed. BymeansofWaveletToolboxinMATIAB. theapplicationofwaveleta-nalysistoimageenhancement, especiallyimagede-noisingfordetectingfabricdefects, isstudied, andthetwokindsofde-noising: globaIthresholdingandlevel-dependentthresholdingarecompared. Theresultsshowthatthenoiseorotherthingsneedlesscanbeeasilyseparatedbymeansofwavelettransformation. Itistestifiedthatwaveletanalysisappliedtoimageenhancementfordetectingfabricdefectscaneffectivelye-liminatethenoiseandtheinfluenceoffabricgrainandlevel-dependentthresholdingispriortoglobalthresholding,[link widoczny dla zalogowanych], Keywords: waveletanalysiswaveletde-noisingprocess; imageerdaancement; fabricdefectsdetection
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