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| Lead evidence of scanning electron microscope and energy spectrum identification methods
00B scanning electron microscope, the date of closing scissors: 2OOll0-08 Author: ZHANG Yu-xia (1966),ugg prezzo, female teachers in Guizhou Normal University Bachelor of real ray spectrometer 222 ・ T1'45400X 2.2 Experimental method first X-ray spectrometer copper wire on the two components were identified,ed hardy clothing, if the two wires of different composition, the negative conclusion can be drawn immediately, do not carry out the following work. The EDS analysis revealed that the two cases are pure copper conductor wires, this is a two-conductor wire for the same necessary condition. But the same can not be a two-conductor wire. Taking into account in drawing copper wire molding, mold, or by the impact of hard particles with a surface of copper wire in the La Ji scratches left by the manufacturing process should be the same stripe, so you can compare the two wires through the copper surface stripes to identify scratches. Copper wire to take the short about two 1.5era, alcohol or acetone with anhydrous copper: toxic clean the surface, placed in scanning electron microscopy and shooting 0 scratches the surface of copper wire stripes. As far as possible the surface of a copper stripe clear images all week, shooting down, for comparison purposes. Figure l is a bundle of copper wire body scratches the surface of the stripes, Figure 2 is a suspect in the workplace scratches the surface of copper conductor stripes, Figure 3 is Figure 1 and 2 spliced together scratches stripes Comparison chart (Figure under I, for the Figure 2). ZHANG Yu-xia et al: Evidence wire SEM and EDS Figure 1 Identification of binding the surface of the body cut out copper wire marks fringes 2 suspects in the workplace scratches the surface of copper wire striped two-wire scratches Figure 3 Figure 3 Comparison of fringe Results and discussion 3.1 Comparison of wire scratches fringe analysis of two wire scratches Figure 3 stripes. See Figure 1 bundle scratch the surface of the body stripes of copper wires in the A, B, c. D and E scratch stripe width and distance with the Figure 2 suspects in the workplace scratch the surface of copper conductor stripes in a, b. c, d and e from scratch stripe width and full kiss sets. Originally concluded the two-wire cable with a 3.2 Conclusion first configuration by scanning electron microscope x-ray spectrometer to quickly identify the composition of wire. If the wire components are inconsistent,air jordan shoes cheap, can immediately conclude that the extraordinary ~ wire; if the composition of the same wire, it can not determine the conclusions lead to the same cable wire for the same composition, by comparing the lead in the production and use of specific provisions generated in the process pattern to determine whether they are for the same wire in this case, taken to the fullest extent possible through the wires that form the surface scratches stripes,ugg milano, to distinguish which is the characteristic stripes, what other non-characteristic stripes. As a non-conductor flat sample, magnification should be sufficiently large so as to avoid the shooting angle of the different stripes caused larger error distance and size, resulting in wrong judgments References: [1] [2] application bundles are the temple SF. Analysis of human hair M __J]. Electron teaching newspaper, 1992. 】 1 (4): 267. Xu root, and so on. Evidence Technology [M] Beijing: China People's University: ugly Press,】 9,906,973. (Continued from 230 and) Miss Cheung Guangjie Wen-Jer Chen Shi-Jia-Guang Chen bashing of Aeronautical Materials, Beijing pea (Ph.D.) Department of Materials Engineering, Shanghai University (Professor) Materials Science and Engineering, Fuzhou University College (Dean. Ph.D.) Shanghai Jiaotong University (Ph.D.) Baoshan Iron and Steel (Group) Baosteel Technology Center (professor Engineering) Wu Liansheng Shanghai Material Research Institute (professor Engineering) Tang Rujun Shanghai Material Research Institute (professor Engineering) TESTING AND Shanghai Material Research Institute (professor Engineering) chemical group group Length: CHEMICAL Members: (in alphabetical order) First Shanghai Research Institute of Materials Malaysia Chong (Professor, Senior Engineer) Department of Chemistry, Fudan University, the Deng family chess (Ph.D.) LIU Shao-Pu Environmental Chemistry, Southwest Normal University (Shanghai Materials Research CHEMICAL Ph.D. 1 The (Engineering professor) Hong Shen Shanghai Automotive Industry Group Technology Center (Senior Engineer) Chen Tianyu Shanghai Institute of Ceramics Testing Center (Fellow) Qiu Deren Department of Chemistry (Professor) HU Zhen Yuan Shanghai Institute of Organic Chemistry Chinese Academy of Sciences (Fellow) Hu Yong-ping, Zhejiang Institute of Geology and Mineral Resources (Director. 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